| 摘要 |
It is possible to effectively inspect a line defect of a data line and a gate line in a liquid crystal display device. A logic circuit for inspection is arranged according to the wire layout structure of a semiconductor substrate of the liquid crystal display device. The input of this logic circuit is connected to an end of the data line. When performing inspection, an inspection drive signal corresponding to a predetermined logic value is applied to the data line and the output of the logic circuit obtained here is used to judge the defect of the data line. This means that the defect of the data line can be judged by the logic value outputted from the logic circuit, i.e., the state of the binary value. Moreover, such a structure is applied to the gate line.
|
