| 摘要 |
Method for determining the thickness of insulation of flat cable in the area of metallic conductors, whereby one side of the cable is irradiated with X-radiation in the area of a metallic conductor and a detector is used on the same or opposite side of the cable to measure the intensity of X-ray luminescence radiation caused by the X-radiation. The detector is shielded from the actual X-radiation. An independent claim is made for a device for measuring the thickness of the insulation of flat cable. |
