| 摘要 |
<p>Contacting devices (31a-m) are installed in a stationary position around the circumference of a rotor (1). Each of these contacting devices is equipped with card transport devices (32), which pick up the cards (8) fed by the card transport device of the rotor (1) and return them after loading to the card transport device (16). The latter is provided at least one other contacting device (38) for test reading an IC (35).</p> |
