发明名称 Circuit and method for automatic measurement and compensation of transistor threshold voltage mismatch
摘要 An automatic transistor threshold measuring circuit ( 100 ) can include a current source circuit ( 102 ) that can provide increasing amounts of current to a measured transistor (N 1 ) according to current setting values (I<SUB>CODE</SUB>). When a gate-to-source voltage of measured transistor (N 1 ) essentially equals a first reference voltage (Vref 1 ), the current setting values (I<SUB>CODE</SUB>) is stored. The process is repeated with a second reference voltage (Vref 1 ) to acquire a second current setting value (I<SUB>CODE</SUB>) A threshold voltage for the measured transistor (N 1 ) can be calculated according to the reference voltages (Vref 1 and Vref 2 ) and stored current setting values (I<SUB>CODE</SUB>).
申请公布号 US7038482(B1) 申请公布日期 2006.05.02
申请号 US20050040441 申请日期 2005.01.21
申请人 CYPRESS SEMICONDUCTOR CORPORATION 发明人 BI YAFEI
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
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