发明名称 Method of fabricating a low-defect strained epitaxial germanium film on silicon
摘要 A method of fabricating a germanium film on a silicon substrate includes preparing a silicon substrate; depositing a first germanium film to form a continuous germanium film on the silicon substrate; annealing the silicon substrate and the germanium film thereon in a first annealing process to relax the germanium film; depositing a second germanium film on the first germanium film to form a germanium layer; patterning and etching the germanium layer; depositing a layer of dielectric material on the germanium layer; cyclic annealing the silicon substrate having the germanium layer and dielectric material thereon; and completing a device containing the silicon substrate and germanium layer.
申请公布号 US7037856(B1) 申请公布日期 2006.05.02
申请号 US20050149883 申请日期 2005.06.10
申请人 SHARP LABORATORIES OF AMERICA, INC. 发明人 MAA JER-SHEN;TWEET DOUGLAS J.;LEE JONG-JAN;HSU SHENG TENG
分类号 H01L21/31 主分类号 H01L21/31
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