发明名称 |
Semiconductor memory device for testifying over-driving quantity depending on position |
摘要 |
A semiconductor memory device is capable of testifying over-driving quantity depending on position. A semiconductor memory device includes a plurality of in-bank over-drivers for temporarily applying a high voltage to a normal power that is supplied to a memory array cell within a bank; a plurality of out-bank over-drivers arranged outside the bank for temporarily applying the high voltage to the normal power that is supplied to the bank; a plurality of PERI over-drivers arranged at the peripheral area for temporarily applying the high voltage to the normal power; a mode register set for receiving a signal to select one of the over-drivers; and a decoder activated in response to a test mode signal for decoding the set value of the MRS to selectively drive the over-driver arranged at a desired position and having desired driving power among the in-bank and out-bank over-drivers and the PERI over-drivers.
|
申请公布号 |
US7038957(B2) |
申请公布日期 |
2006.05.02 |
申请号 |
US20040022803 |
申请日期 |
2004.12.28 |
申请人 |
HYNIX SEMICONDUCTOR, INC. |
发明人 |
KWACK SEUNG-WOOK;KIM KWAN-WEON |
分类号 |
G11C7/00;G11C29/00;G11C29/12 |
主分类号 |
G11C7/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|