发明名称 Local SONOS-type nonvolatile memory device and method of manufacturing the same
摘要 Provided are a local SONOS-type memory device and a method of manufacturing the same. The device includes a gate oxide layer formed on a silicon substrate; a conductive spacer and a dummy spacer, which are formed on the gate oxide layer and separated apart from each other, the conductive spacer and the dummy spacer having round surfaces that face outward; a pair of insulating spacers formed on a sidewall of the conductive spacer and a sidewall of the dummy spacer which face each other; an ONO layer formed in a self-aligned manner between the pair of insulating spacers; a conductive layer formed on the ONO layer in a self-aligned manner between the pair of insulating spacers; and source and drain regions formed in the silicon substrate outside the conductive spacer and the dummy spacer.
申请公布号 US7037781(B2) 申请公布日期 2006.05.02
申请号 US20040888660 申请日期 2004.07.09
申请人 SAMSUNG ELECTRONICS, CO., LTD. 发明人 CHOI YONG-SUK;YOON SEUNG-BEOM;KIM SEONG-GYUN
分类号 H01L21/336;H01L21/8247;H01L21/28;H01L21/8246;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/336
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