发明名称 LITHOGRAPHY MASK STRUCTURE
摘要 <p>The invention relates to a reflecting lithography mask comprising a reflecting coating (RR) and a stack which are arranged on a substrate (S), wherein said stack consists of an engraving preventing layer and an absorption layer and covers a part of the reflecting coating, only. Said absorption layer is made of a dielectric material only and forms a layer on the mask surface. Appropriately, said dielectric material is embodied in the form of HfO<sub</p>
申请公布号 WO2006043004(A1) 申请公布日期 2006.04.27
申请号 WO2005FR50868 申请日期 2005.10.19
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE;CHARPIN-NICOLLE, CHRISTELLE;ROBIC, JEAN-YVES 发明人 CHARPIN-NICOLLE, CHRISTELLE;ROBIC, JEAN-YVES
分类号 G03F1/22;G03F1/24;G03F1/54 主分类号 G03F1/22
代理机构 代理人
主权项
地址