发明名称 |
LITHOGRAPHY MASK STRUCTURE |
摘要 |
<p>The invention relates to a reflecting lithography mask comprising a reflecting coating (RR) and a stack which are arranged on a substrate (S), wherein said stack consists of an engraving preventing layer and an absorption layer and covers a part of the reflecting coating, only. Said absorption layer is made of a dielectric material only and forms a layer on the mask surface. Appropriately, said dielectric material is embodied in the form of HfO<sub</p> |
申请公布号 |
WO2006043004(A1) |
申请公布日期 |
2006.04.27 |
申请号 |
WO2005FR50868 |
申请日期 |
2005.10.19 |
申请人 |
COMMISSARIAT A L'ENERGIE ATOMIQUE;CHARPIN-NICOLLE, CHRISTELLE;ROBIC, JEAN-YVES |
发明人 |
CHARPIN-NICOLLE, CHRISTELLE;ROBIC, JEAN-YVES |
分类号 |
G03F1/22;G03F1/24;G03F1/54 |
主分类号 |
G03F1/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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