MEMORY DEVICE CONFIGURED TO DETECT FAILURE OF TEMPERATURE SENSOR THEREOF AND METHOD OF OPERATING AND TESTING THE SAME

摘要

PROBLEM TO BE SOLVED: To provide a temperature compensation type self-refresh semiconductor memory device detecting failure of a temperature sensor and to provide operating and testing methods of a memory device using the same.

SOLUTION: The memory device includes a temperature sensor configured to generate a temperature detection signal responsively to a temperature of the memory device and a self-refresh control circuit configured to control a refresh of the memory device responsively to the temperature detection signal. The device further includes a temperature-detection-error sensing circuit configured to activate a temperature-detection-error signal responsively to an error in the temperature detection signal. Thereby, the semiconductor memory device having a problem in current characteristics due to failure of the temperature sensor can be detected at an early stage.

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