| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor test system which can cope flexibly with large capacity of a semiconductor device to be tested without burdening a high cost. SOLUTION: This system has a test apparatus 10 performing a test about a semiconductor device having a redundant circuit and obtaining fail information about a defective part of a semiconductor device, fail memories 36a to 36d storing fail information, a redundant relieving determination part 40 determination whether redundant relieving in which a defective part of a semiconductor device is replaced by a redundant circuit based on the fail information stored in the fail memories 36a to 36d is required or not, also the system has a redundant relieving determination apparatus 14 provided independently from the test apparatus 10, the test apparatus 10 and the redundant relieving determination apparatus 14 are connected through a network 12, and the fail information is sent to the redundant relieving determination apparatus 14 from the test apparatus 10. COPYRIGHT: (C)2006,JPO&NCIPI
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