发明名称 SYSTEMS AND METHODS FOR MEASURING SAMPLE SURFACE FLATNESS OF CONTINUOUSLY MOVING SAMPLES
摘要 Measurement of sample surface flatness of a continuously moving sample. A conveyor continuously conveys a sample beneath a grating disposed at a non zero angle with respect to the plane of conveyance. The relative distance between the sample and the angled grating changes with the horizontal translation of the sample. A camera disposed above the sample and the grating captures, at constant time intervals, a sequence of images, each image comprising a shadow moiré fringe pattern that is indicative of the sample's surface flatness. The continuous change in relative distance between the sample and the grating introduces a known or unknown phase step between the shadow moiré fringe patterns of each successive image. A computer associated with the camera processes the images to determine phase values of pixels at, and the relative height of the sample surface at, selected pixel locations of the sample.
申请公布号 WO2006044185(A2) 申请公布日期 2006.04.27
申请号 WO2005US35623 申请日期 2005.09.30
申请人 AKROMETRIX, LLC;ZWEMER, DIRK, ADRIAN;PETRICCIONE, GREGORY, JAMES;MCCARRON, SEAN, PATRICK;PAN, JIAHUI 发明人 ZWEMER, DIRK, ADRIAN;PETRICCIONE, GREGORY, JAMES;MCCARRON, SEAN, PATRICK;PAN, JIAHUI
分类号 G01B11/24 主分类号 G01B11/24
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