发明名称 METHODS OF FORMING CONDUCTIVE STRUCTURES INCLUDING TITANIUM-TUNGSTEN BASE LAYERS AND RELATED STRUCTURES
摘要 <p>Methods may be provided for forming an electronic device including a substrate, a conductive pad on the substrate, and an insulating layer on the substrate wherein the insulating layer has a via hole therein exposing a portion of the conductive pad. In particular, a conductive structure may be formed on the insulating layer and on the exposed portion of the conductive pad. The conductive structure may include a base layer of titanium-tungsten (TiW) and a conduction layer of at least one of aluminum and/or copper. Moreover, the base layer of the conductive structure may be between the conduction layer and the insulating layer. Related devices are also discussed.</p>
申请公布号 EP1649508(A2) 申请公布日期 2006.04.26
申请号 EP20040778453 申请日期 2004.07.16
申请人 UNITIVE INTERNATIONAL LIMITED 发明人 MIS, DANIEL, J.;ZEHNDER, DEAN
分类号 H01L21/60;H01L23/532;(IPC1-7):H01L21/60 主分类号 H01L21/60
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