Electro-optic micrometer for measuring physical magnitude, has control device controlling coherently optical source, detector and processing unit, which process voltage detection signal to provide measurement signal, based on magnitude

摘要

#CMT# #/CMT# The micrometer has an optical source (EM) electrically controlled to emit light beams comprising wavelengths. An optical detector (DEC) detects a light signal at the wavelengths to provide an electric voltage detection signal that is processed by a processing unit (UT) to provide a measurement signal. A control device (CC) controls in coherence the source, detector and unit (UT) based on magnitude to be measured. #CMT#USE : #/CMT# Used for measuring optical characteristics of different mediums and/or for measuring physical magnitudes of the mediums using optical beams (claimed). #CMT#ADVANTAGE : #/CMT# The multimeter is compact, and permits to provide different types of measurements. The single multimeter permits to provide different functions of fluxmeter, luxmeter, wattmeter, photometer, optical density meter, Reflectometer Bridge, spectrophotometer, lambda meter, calorimeter, spectrometer, gonio-spectro-photometer, gonio-reflectometer, refractometer, glossimeter, diffusiometer, circular/linear polarimeter, optical fiber controller, deviation indicator, beam profile meter, distance and thickness sensor, position and speed sensor and optoelectronic component test bed. The multimeter is thus economic and is flexible to be used by a user. #CMT#DESCRIPTION OF DRAWINGS : #/CMT# The drawing shows a diagram of an electro-optic multimeter. CC : Control device DEC : Optical detector DIS : Communication interface EM : Optical source HO : Clock UT : Processing unit.