摘要 |
An X-ray or neutron-optical analysis device comprising means for directing radiation from a source ( 1 ) onto a sample ( 2 ), and a detector ( 7 ) with n substantially identical detector elements (D<SUB>i</SUB>) which are disposed parallel, next to each other in a first direction x and which extend in strips in a second direction y, wherein i=1, . . . n, for one-dimensional spatially-resolved detection of radiation reflected, scattered or diffracted by the sample ( 2 ) onto the detector ( 7 ), and with a detection electronics for processing the detector signals of the n detector elements (D<SUB>i</SUB>), wherein the detection electronics can reliably process a maximum radiation intensity per detector element (D<SUB>i</SUB>) without overloading, is characterized in that an optical element is disposed in front of the detector ( 7 ) which covers or weakens radiation incident on the surfaces of the respective n detector elements (D<SUB>i</SUB>) in correspondence with a predetermined, non-constant transmission function f(x) and/or the optical element comprises a collimator ( 6 ) which can be displaced along the strip direction y. The inventive analysis device permits artificial enlargement of the dynamic range of the detector ( 7 ).
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