发明名称 DEVICE FOR CREATING KNOWLEDGE, PARAMETER RETRIEVING METHOD, AND PROGRAM PRODUCT
摘要 PROBLEM TO BE SOLVED: To provide a device capable of easily retrieving/determining discrimination knowledge suitable for determining normal/abnormal of an inspected object in an inspecting/diagnosing device. SOLUTION: The device comprises a feature amount calculating section 11 for calculating a plurality of feature amounts of data for learning including normal data and abnormal data based on various parameters, a primary evaluation section 12 for outputting the goodness of the various parameters as an evaluation value based on a calculation result of the feature amounts determined by the feature amount calculating section, an optimum solution candidate output means 14 for outputting, as a plurality of optimum solution candidates, the result of the primary evaluation determined by the primary evaluation section and a plurality of parameter retrieving results having the high primary evaluation value, a discrimination knowledge producing section 15 for producing the discrimination knowledge based on the plurality of optimum solution candidates outputted from the optimum solution candidate output means, a secondary evaluation section 16 for evaluating a plurality of pieces of discrimination knowledge produced in the discrimination knowledge producing section, and an optimum solution output section 17 for outputting the discrimination knowledge having a high evaluation value as the optimum solution based on the result of the secondary evaluation. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006105943(A) 申请公布日期 2006.04.20
申请号 JP20040297034 申请日期 2004.10.08
申请人 OMRON CORP 发明人 INABA HIRONORI;KOJIYA KAZUTO;HIRAYAMA YUJI
分类号 G01H17/00;G01M99/00;G06N3/00 主分类号 G01H17/00
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