发明名称 COMMON SOURCE LINE CONTROL SCHEME OF NONVOLATILE MEMORY DEVICE FOR IMPROVING READ CHARACTERISTIC
摘要 <P>PROBLEM TO BE SOLVED: To provide a common source line control scheme of a nonvolatile memory device for improving read characteristic. <P>SOLUTION: The nonvolatile memory device demonstrated here includes memory blocks each of which has a plurality of word lines. A common source line is arranged to be shared by the memory blocks. A first transistor is connected to the common source line, A second transistor connects the first transistor to reference voltage during read operation.Voltage higher than power supply voltage is applied to a gate of the first transistor during the read operation. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006107709(A) 申请公布日期 2006.04.20
申请号 JP20050276469 申请日期 2005.09.22
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 KANG SANG-CHUL;LEE JIN-YUB
分类号 G11C16/06 主分类号 G11C16/06
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