发明名称 ICP EMISSION SPECTROMETER
摘要 PROBLEM TO BE SOLVED: To provide an ICP emission spectrometer equipped with a plasma torch which dispenses with optical regulation before measurement, enables stable measurement of high sensitivity and can be used for another purpose simultaneously with the emission analysis of a plasma flame. SOLUTION: An optical system, which has the plasma torch A having a coaxial multilayered conical pipe structure, forms the plasma flame 1 to the top part of a conical pipe and can observe the emission of the plasma flame from the bottom part direction of the plasma torch, is provided. Concretely, a condensing lens is provided to the center of the coaxial multilayered conical pipe. The shape dimension of the plasma torch A is subjected to design processing so that the maximum emission point of the plasma torch A coincides with the focal position of the condenser lens of a spectroscope B. Further, a spray chamber 8 is integrally provided in the plasma torch A along with a labeller L. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006105616(A) 申请公布日期 2006.04.20
申请号 JP20040288846 申请日期 2004.09.30
申请人 SHIMADZU CORP 发明人 IKEDA YUICHIRO
分类号 G01N21/73;G01N21/68 主分类号 G01N21/73
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