发明名称 MEMORY REGULATOR SYSTEM WITH TEST MODE
摘要 <p>A system for switching between a read mode and a write mode. The system includes a voltage regulating circuit and a memory array. The voltage regulating circuit includes a voltage input and a control input, wherein the control input regulates the voltage input between at least a first voltage output and a second voltage output. The voltage regulating circuit is in electrical communication with the memory array and supplies the memory array with the first voltage output to correspond to the read mode and the second voltage output to correspond to the write mode.</p>
申请公布号 WO2006042058(A2) 申请公布日期 2006.04.20
申请号 WO2005US36063 申请日期 2005.10.07
申请人 LEXMARK INTERNATIONAL, INC 发明人 AHNE, ADAM, J.;EDELEN, JOHN, G.
分类号 G11C29/00 主分类号 G11C29/00
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