| 摘要 |
An apparatus and method using a reduced number of nonvolatile programming elements for enabling redundant memory blocks in a semiconductor memory is disclosed. A redundancy selection module may be configured using N fuses to configure and select 2<SUP>N</SUP>-1 repair modules. Programming fuses effectively separates the repair modules into two sets, those with an even address and those with an odd address. Each repair module contains fuses programmed with a selected address, such that the repair module may respond when an address input matches the selected address. However, the least significant bit is left out of the programming. As a result, repair modules in the even set respond to even addresses matching the selected address and repair modules in the odd set respond to odd addresses matching the selected address. Similar arrangements may be used to reduce the number of enable fuses and disable fuses required for each repair module.
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