| 摘要 |
The disclosed embodiments relate to a method and apparatus for identifying short circuits in an integrated circuit device. The method may comprise the acts of programming a first memory cell associated with a first digit line to a first data value, programming a second memory cell associated with a second digit line to a second data value, the second data value being complementary with respect to the first data value, firing a first sense amplifier associated with the first digit line, firing a second sense amplifier associated with the second digit line after a time delay with respect to the act of firing the first sense amplifier associated with the first digit line, detecting a measured data value associated with the second digit line, and comparing the measured data value to the second data value to determine whether the first digit line is short circuited to the second digit line. The apparatus may comprise a first sense amplifier that is associated with a first digit line, a second sense amplifier that is associated with a second digit line, and a circuit that delays a firing operation of the second sense amplifier with respect to a firing operation of the first sense amplifier to allow detection of a short circuit between the first digit line and the second digit line.
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