发明名称 ETCHING METHOD FOR COMPOUND SEMICONDUCTOR
摘要 PROBLEM TO BE SOLVED: To provide a method by which an AlGaInP system semiconductor layer and the other semiconductor layers can be respectively etched at relatively close etching speed by using an easily handleable etchant, and also, a smooth surface can be obtained after etching. SOLUTION: The AlGaInP system semiconductor layer and the other semiconductor layers are etched by using the etchant made of an acid solution including a halogen oxygen acid ion. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006108441(A) 申请公布日期 2006.04.20
申请号 JP20040293972 申请日期 2004.10.06
申请人 MITSUBISHI CHEMICALS CORP 发明人 FUKADA TAKASHI
分类号 H01S5/22;H01L21/306 主分类号 H01S5/22
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