发明名称 Solid state imaging device and method for producing the same
摘要 On a light shielding film 7, an anti-oxidation layer 9 covering at least the light shielding film 7 is formed. The anti-oxidation layer 9 is formed under a condition which does not oxidize a surface of the light shielding film 7. The anti-oxidation layer 9 is formed of a high melting point metal compound film having a light shielding property or an insulating film having a light transmissive property. Thus, the scattering ratio of the incident light at the surface of the light shielding film 7 can be uniform among all the pixels, and as a result, a solid state imaging device having suppressed sensitivity non-uniformity can be realized. Since the surface of the light shielding film 7 is not oxidized, the thickness of the light shielding film 7 can be reduced. Thus, the present invention can comply with the demand for size reduction of the pixels.
申请公布号 US2006081848(A1) 申请公布日期 2006.04.20
申请号 US20050080418 申请日期 2005.03.16
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 NIISOE NAOTO;OGATA HIROE;NISHIO RIEKO;YANO TOSHIHIKO;DOI HITOSHI
分类号 G03B17/26;H01L27/14;H01L27/148;H04N5/335;H04N5/365;H04N5/369;H04N5/372 主分类号 G03B17/26
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