TEST DEVICE, TEST METHOD, AND ELECTRONIC DEVICE

摘要

A test device tests a switching speed of a circuit including a logical element at a pre-stage and a logical element at a post-stage for inputting the output signal of the pre-stage logical element. The post-stage logical element includes a post-stage FET for inputting an output signal to a gate terminal and outputting different levels of voltage when the voltage of the output signal is greater or smaller than a threshold voltage. The test device includes: a threshold voltage setting unit for setting a substrate voltage of the post-stage FET to a value different from the substrate voltage during normal operation of the circuit so as to set a threshold voltage different from that of the normal operation at the post-stage FET; a delay time measuring unit for measuring a delay time of the circuit where a threshold value different from that of the normal operation is set; a failure detection unit for detecting failure of the switching speed of the circuit according to the delay time.