发明名称 |
POSITIVE PHOTORESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN |
摘要 |
A positive photoresist composition comprising an alkali-soluble novolak resin (A) containing a structural unit (al) represented by a general formula (I) shown below, and a structural unit (a2) represented by a general formula (II) shown below, and a photosensitizer (B).
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申请公布号 |
KR20060033010(A) |
申请公布日期 |
2006.04.18 |
申请号 |
KR20067000694 |
申请日期 |
2006.01.11 |
申请人 |
TOKYO OHKA KOGYO CO., LTD. |
发明人 |
MASUDA YASUO;OKUI TOSHIKI |
分类号 |
G03F7/023;C08G8/10;C08L61/06;G03F7/00;H01L21/027 |
主分类号 |
G03F7/023 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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