发明名称 POSITIVE PHOTORESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN
摘要 A positive photoresist composition comprising an alkali-soluble novolak resin (A) containing a structural unit (al) represented by a general formula (I) shown below, and a structural unit (a2) represented by a general formula (II) shown below, and a photosensitizer (B).
申请公布号 KR20060033010(A) 申请公布日期 2006.04.18
申请号 KR20067000694 申请日期 2006.01.11
申请人 TOKYO OHKA KOGYO CO., LTD. 发明人 MASUDA YASUO;OKUI TOSHIKI
分类号 G03F7/023;C08G8/10;C08L61/06;G03F7/00;H01L21/027 主分类号 G03F7/023
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