发明名称 Process of fabricating write pole in magnetic recording head using rhodium CMP stop layer
摘要 In the formation of the top magnetic write pole in a thin film magnetic recording head, a CMP stop layer comprising rhodium is deposited over the Al<SUB>2</SUB>O<SUB>3 </SUB>layer that overlies the top magnetic pole. A mixture of silicon dioxide, ammonium persulfate and benzotriazole is employed as a slurry in the CMP process that removes the portion of the Al<SUB>2</SUB>O<SUB>3 </SUB>layer covering the top magnetic pole. This eliminates the need for an extra thick layer of Al<SUB>2</SUB>O<SUB>3 </SUB>to be first deposited over the top pole and then removed to expose the top pole. The magnetic layer that forms the top pole can be plated to the target thickness of the top pole. As a result, the thickness of the photoresist layer that is used to define the size and shape of the top pole can be decreased to a desirable thickness, facilitating the use of DUV radiation to expose the photoresist layer.
申请公布号 US7029376(B1) 申请公布日期 2006.04.18
申请号 US20050225907 申请日期 2005.09.14
申请人 HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V. 发明人 GUTHRIE HUNG-CHIN;JIANG MING;LO JYH-SHUEY;ZHANG HONG
分类号 G11B5/127 主分类号 G11B5/127
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