发明名称 SENSOR USING TOTAL REFLECTION ATTENUATION
摘要 PROBLEM TO BE SOLVED: To shorten a measuring time without lowering measuring precision for coupling between a sensing substance and a specimen, in a sensor using a total reflection attenuation surface plasmon or the like. SOLUTION: A variation R of a total reflection attenuation angleθ<SB>SP</SB>reflecting a state of the coupling between the sensing substance and the specimen is measured with 0.5 sec interval from start of measurement, a ratio P(i)=R(i-1)/R(i) that is the ration of a variation R(i-1) before 10 sec to a variation R(i) (where i is a determination frequency) is calculated in every 10 sec of lapse time, a temporal finish state is determined when the ratio P(i) is 0.97 or more, and the coupling is determined to be completed and the measurement of the coupling state is finished, when the temporal finish states are determined successively three times. The measurement is finished in a short time as to the specimen of a fast coupling speed to the sensing substance. A long time of measurement is continued until a coupling action is finished, as to the specimen of a slow coupling speed, to determine accurately the coupling condition. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006098370(A) 申请公布日期 2006.04.13
申请号 JP20040288106 申请日期 2004.09.30
申请人 FUJI PHOTO FILM CO LTD 发明人 OTSUKA TAKASHI
分类号 G01N21/27 主分类号 G01N21/27
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