| 摘要 |
PROBLEM TO BE SOLVED: To compensate noises occurring in supplying a new specimen to an instrument as to a measuring method and the measuring instrument for performing specimen analysis by generating an evanescent wave by causing a light beam to be totally reflected by a boundary face between a thin film layer adjoining a measuring object such as the specimen and a dielectric block, and thereby measuring a change arising in the intensity of the totally reflected light beam to perform specimen analysis. SOLUTION: Preliminary measurement is performed on noise signals occurring in supplying a new buffer (specimen) to a measurement part 63. The result thereof is stored in an unillustrated storage means in a signal processing part 20. Compensation is performed in such a way that noise signals occurring in supplying a new specimen at the time of regular measurement are removed on the basis of noise signals obtained in the preliminary measurement. COPYRIGHT: (C)2006,JPO&NCIPI
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