发明名称 Material surface analyzing method
摘要 A material surface analyzing method includes measuring composition of elements at each data point after setting M-number data points on a sample surface containing N-number elements, calculating a concentration distance value between the data points using the measured composition of the elements, and determining a phase distribution of the sample surface using the calculated concentration distance value.
申请公布号 US2006076486(A1) 申请公布日期 2006.04.13
申请号 US20050246237 申请日期 2005.10.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 ASANOV IGOR
分类号 H01J40/00 主分类号 H01J40/00
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