发明名称 HIGH WITHSTAND VOLTAGE SEMICONDUCTOR DEVICE COVERED WITH RESIN AND PROCESS FOR PRODUCING THE SAME
摘要 In the step of applying a sealing resin to a high withstand voltage semiconductor chip mounted on a package or substrate and hardening the same, the resin hardening is performed while applying a high voltage between at least either an electrode terminal connected with a wire, etc. to the chip or a chip electrode and another electrode requiring an insulation voltage endurance between the same and the above electrode terminal. As the sealing resin, use is made of a synthetic polymer compound consisting of, linked together three-dimensionally by covalent bonds, organosilicon polymers (C) formed by alternately linearly linking, by siloxane bonds, organosilicon polymers (A) having a crosslink structure by siloxane and organosilicon polymers (B) having a linearly linked structure by siloxane (Si-O-Si bonded matter). Thus, in the use of a high withstand voltage semiconductor chip mounted on a substrate or package and sealed with the resin, any increase of current leakage can be suppressed even when high inverse voltage is applied, thereby attaining a stable insulation power endurance agreeing with designed value.
申请公布号 WO2006038644(A1) 申请公布日期 2006.04.13
申请号 WO2005JP18420 申请日期 2005.10.05
申请人 THE KANSAI ELECTRIC POWER CO., INC.;ASAHI DENKA CO., LTD.;OKADA, SHINICHI;SUGAWARA, YOSHITAKA;ASANO, KATSUNORI;TAKAYAMA, DAISUKE;SHOJI, YOSHIKAZU;JANADO, TADASHI;SUEYOSHI, TAKASHI;HIWATARI, KEN-ICHIRO 发明人 OKADA, SHINICHI;SUGAWARA, YOSHITAKA;ASANO, KATSUNORI;TAKAYAMA, DAISUKE;SHOJI, YOSHIKAZU;JANADO, TADASHI;SUEYOSHI, TAKASHI;HIWATARI, KEN-ICHIRO
分类号 H01L23/29;H01L21/56 主分类号 H01L23/29
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