| 摘要 |
PROBLEM TO BE SOLVED: To provide an emissivity measurement apparatus which can measure emissivity by a simple operation only bringing the apparatus into contact with an object to be measured and can measure the emissivity of the object to be measured with high precision. SOLUTION: The emissivity measurement apparatus 10 comprises an integrating sphere 18 and an arithmetic and control means 19. The integrating sphere 18 comprises an incident hole 12 allowing radiation energy from an infrared light source 11 to enter, a sample hole 14 which is placed facing an incident direction X from the incident hole 12 and of which the opening rim is brought into contact with the object to be measured 13, and a detection hole 16 on which a detector 15 for detecting the radiation energy is placed. The arithmetic and control means 19 is connected to the detector 15. The detector 15 detects the radiation energy from the object to be measured 13 multiply scattered by the integrating sphere 18 through the detection hole 16 and compares it with the emissivity of a known sample by the arithmetic and control means 19 to calculate the emissivity of the object to be measured 13. A temperature sensor for temperature correction is provided on the opening rim of the sample hole 14. COPYRIGHT: (C)2006,JPO&NCIPI
|
