发明名称 PLASMA PROCESSING SYSTEM FOR TREATING A SUBSTRATE
摘要 <p>A plasma processing system for treating a substrate includes a processing chamber including a first chamber portion configured to receive a first gas for providing a plasma space, and a second chamber portion configured to receive a second gas for providing a process space having process chemistry to treat the substrate. A substrate holder is coupled to the second chamber portion of the processing chamber, and configured to support the substrate proximate the process space, and a plasma source is coupled to the first chamber portion of the processing chamber, and configured to form a plasma in the plasma space. A grid is located between the plasma space and the process space, and configured to permit the diffusion of the plasma between the plasma space and the process space in order to form the process chemistry from the process gas.</p>
申请公布号 WO2006038976(A2) 申请公布日期 2006.04.13
申请号 WO2005US28326 申请日期 2005.08.10
申请人 TOKYO ELECTRON LIMITED;CHEN, LEE;KAMBARA, HIROMITSU;TIAN, CAIZ, HONG;NISHIZUKA, TETSUYA;NOZAWA, TOSHIHISA 发明人 CHEN, LEE;KAMBARA, HIROMITSU;TIAN, CAIZ, HONG;NISHIZUKA, TETSUYA;NOZAWA, TOSHIHISA
分类号 H01L21/306 主分类号 H01L21/306
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