发明名称 |
Integrierte Halbleiterschaltung |
摘要 |
A semiconductor integrated circuit includes: a plurality of circuits to be tested, each having the same structure; test paths each provided for one of the circuits to be tested; and a comparator receiving, via the test paths, test outputs sent from the circuits to be tested, comparing the test outputs, and determining whether the test outputs match with each other or not. <IMAGE> |
申请公布号 |
DE60203032(T2) |
申请公布日期 |
2006.04.13 |
申请号 |
DE2002603032T |
申请日期 |
2002.09.25 |
申请人 |
KABUSHIKI KAISHA TOSHIBA, TOKIO/TOKYO |
发明人 |
KAMEI, TAKAYUKI;URAKAWA, YUKIHIRO |
分类号 |
G01R31/28;G01R31/3185;H01L21/66;H03K19/00 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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