发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To provide the manufacturing method of a semiconductor device and a semiconductor device capable of avoiding the problem of a processing process, such as failure by a resist pattern. SOLUTION: The manufacturing method of a semiconductor device is provided on a semiconductor substrate with a process for forming a first member to be patterned; a process for forming a connection section which connects the two or more patterns in a line shape, in at least one end side of the patterns in a line shape and two or more line parallel patterns in a line shape by patterning the first member to be patterned; and a process for separating the pattern in a line shape from the connection sections, by etching the section between the pattern in a line shape and the connection sections. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006100412(A) 申请公布日期 2006.04.13
申请号 JP20040282400 申请日期 2004.09.28
申请人 TOSHIBA CORP 发明人 KINOSHITA HIDEYUKI
分类号 H01L21/8247;H01L21/3213;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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