发明名称 |
Memory devices configured to detect failure of temperature sensors thereof and methods of operating and testing same |
摘要 |
A memory device includes a temperature sensor configured to generate a temperature detection signal responsive to a temperature of the memory device and a self-refresh control circuit configured to control a refresh of the memory device responsive to the temperature detection signal. The device further includes a temperature-detection-error sensing circuit configured to assert a temperature-detection-error signal responsive to an error in the temperature detection signal. The temperature-detection-error sensing circuit may be configured to provide the asserted temperature-detection-error signal at a temperature-detection-error sensing pad configured to be coupled to an external device and/or the device may further include a temperature sensor control circuit configured to control the temperature detection signal responsive to the temperature-detection-error signal. Related operating and testing methods may be provided.
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申请公布号 |
US2006077742(A1) |
申请公布日期 |
2006.04.13 |
申请号 |
US20050236372 |
申请日期 |
2005.09.27 |
申请人 |
SHIM JAE-EUNG;CHOI JUNG-YONG;KANG YOUNG-GU;HWANG MIN-GYU |
发明人 |
SHIM JAE-EUNG;CHOI JUNG-YONG;KANG YOUNG-GU;HWANG MIN-GYU |
分类号 |
G11C7/00 |
主分类号 |
G11C7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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