发明名称 IMPROVING SHORT CHANNEL EFFECT OF MOS DEVICES BY RETROGRADE WELL ENGINEERING USING TILTED DOPANT IMPLANTATION INTO RECESSED SOURCE/DRAIN REGIONS
摘要 A method of providing a halo implant region in a substrate of a MOS device having a gate electrode thereon and defining source/drain regions, a MOS device fabricated according to the above method, and a system comprising the MOS device. The method comprises: defining undercut recesses in the substrate at the source/drain regions thereof, the undercut recesses extending beneath the gate electrode; creating a halo implant region beneath the gate electrode between the recesses; and providing raised source/drain structures in the undercut recesses after creating the halo implant region.
申请公布号 WO2006039641(A2) 申请公布日期 2006.04.13
申请号 WO2005US35474 申请日期 2005.09.29
申请人 INTEL CORPORATION;HOFFMANN, THOMAS;TYAGI, SUNIT;CURELLO, GIUSEPPE;SELL, BERNHARD;AUTH, CHRISTOPHER 发明人 HOFFMANN, THOMAS;TYAGI, SUNIT;CURELLO, GIUSEPPE;SELL, BERNHARD;AUTH, CHRISTOPHER
分类号 H01L21/336;H01L21/265;H01L29/78 主分类号 H01L21/336
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