发明名称 Temperature measuring device using a matrix switch, a semiconductor package and a cooling system
摘要 An embodiment relates to a temperature measuring device using a matrix switch, and a semiconductor package. In another embodiment a cooling system may be included. A plurality of temperature sensors may be arranged on a surface of a semiconductor device. The matrix switch may select the temperature sensors by an address method to form a circuit that includes the selected temperature sensor. A measuring unit may receive an output signal of the selected temperature sensor to calculate the temperature at the selected temperature sensor.
申请公布号 US2006075760(A1) 申请公布日期 2006.04.13
申请号 US20050217597 申请日期 2005.08.31
申请人 IM YUN-HYEOK;KANG SUK-CHAE;LEE HEE-SEOK 发明人 IM YUN-HYEOK;KANG SUK-CHAE;LEE HEE-SEOK
分类号 F25B21/02;F24F7/00;F25D23/12;H01L35/28 主分类号 F25B21/02
代理机构 代理人
主权项
地址