发明名称 METHOD OF MANUFACTURING IMAGE DISPLAY DEVICE USING SEMICONDUCTOR THIN FILM DEVICE
摘要 <p>In an MIS field effect transistor having a gate electrode (18) formed on a first semiconductor layer which is a polycrystalline silicon film on an insulating substrate (100) through a gate insulating film (17), a channel region (12) formed in the semiconductor layer and a source region (20) and a drain region (19) arranged on both sides of the channel region (12), a thin film semiconductor device has a main orientation of at least the channel region of ä110ü with respect to the surface of the gate insulating film. Further, a polycrystalline semiconductor film having a main orientation of the surface almost perpendicular to a direction for connecting the source (20) and drain (19) regions of ä100ü is preferably used in the channel (12) of a semiconductor device. According to the present invention, a semiconductor device having a high-quality polycrystalline semiconductor film whose grain boundary, grain size and crystal orientation can be controlled and whose film roughness and crystal defects formed by crystallization have been reduced can be obtained on the insulating substrate (100). <IMAGE> <IMAGE> <IMAGE></p>
申请公布号 KR20060031656(A) 申请公布日期 2006.04.12
申请号 KR20060019461 申请日期 2006.02.28
申请人 KABUSHIKI KAISHA HITACHI SEISAKUSHO(D/B/A HITACHI, LTD.) 发明人 HATANO MUTSUKO;YAMAGUCHI SHINYA;KIMURA YOSHINOBU;PARK, SEONG KEE
分类号 H01L29/786;C30B1/00;H01L21/00;H01L21/20;H01L21/26;H01L21/324;H01L21/336;H01L21/36;H01L21/42;H01L21/44;H01L21/4763;H01L21/477;H01L21/84;H01L23/62;H01L27/01;H01L27/12;H01L31/0328;H01L31/0336;H01L31/0392;H01L31/072;H01L31/109 主分类号 H01L29/786
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