发明名称 Electron beam lithography method
摘要 An electron beam lithography method for performing lithography of elements included in a pattern by scanning a disk having resist coated thereon, placed on a rotating stage which is movable in a radial direction of the disk, with an electron beam while rotating the rotating stage. The electron beam has a beam diameter smaller than a minimum width of an element shape. The electron beam is reciprocally oscillated in a circumferential direction X approximately orthogonal to a radial direction Y of the disk and deflected in the radial direction Y, thereby filling in the element shape. Lithography of the elements is sequentially performed by rotating the disk unidirectionally, and thus a desired micropattern is drawn in the entire region of the disk. A lithographic length L of the element in the circumferential direction X may be defined by amplitude of the reciprocal oscillation of the electron beam.
申请公布号 US7026098(B2) 申请公布日期 2006.04.11
申请号 US20030700626 申请日期 2003.11.05
申请人 FUJI PHOTO FILM CO., LTD. 发明人 KOMATSU KAZUNORI;USA TOSHIHIRO
分类号 G03C5/00;H01J37/20;G03F7/20;G11B5/596;G11B5/82;G11B5/84;G11B5/86;G11B7/26;G11B7/28;H01J37/147;H01J37/305;H01J37/317 主分类号 G03C5/00
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