| 摘要 |
In a digital-to-analog converter including an integrated test circuit, a digital input and an analog output, a comparator ( 5 ) capable of being connected with the analog output ( 4 ) and including a connection ( 7 ) for a reference voltage source, a digital test connection ( 11 ) and a logic element is provided, the logic element being connected with the test connection ( 11 ) for emitting the digital value 0 or 1 as a function of the difference between the voltage at the analog output ( 4 ) and the reference voltage.
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