发明名称 Offset-gate-type semiconductor device
摘要 A semiconductor device includes a first semiconductor region having a first conductivity type, a second semiconductor region formed on the first semiconductor region and having the first conductivity type, a third semiconductor region formed in a surface of the second semiconductor region and having a second conductivity type, a fourth semiconductor region formed in the surface of the second semiconductor region and having the second conductivity type, and a gate structure formed on the second and fourth semiconductor region. The semiconductor device further includes a conductive member arranged in the trench extending from a surface of the fourth semiconductor region to the first semiconductor region, the trench having one sidewall surface flush with a sidewall surface of the gate structure.
申请公布号 US7026214(B2) 申请公布日期 2006.04.11
申请号 US20040957692 申请日期 2004.10.05
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 YASUHARA NORIO;ONO SYOTARO;NAKAMURA KAZUTOSHI;KAWAGUCHI YUSUKE;HODAMA SHINICHI;NAKAGAWA AKIO
分类号 H01L21/00;H01L21/265;H01L21/336;H01L29/06;H01L29/10;H01L29/40;H01L29/417;H01L29/45;H01L29/78 主分类号 H01L21/00
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