发明名称 Particle beam irradiation system and method of adjusting irradiation apparatus
摘要 The present invention provides an increased degree of uniformity of radiation dose distribution for the interior of a diseased part. A particle beam therapy system includes a charged particle beam generation apparatus and an irradiation apparatus. An ion beam is generated by the charged particle beam generation apparatus. The irradiation apparatus exposes a diseased part to the generated ion beam. A scattering device, a range adjustment device, and a Bragg peak spreading device are installed upstream of a first scanning magnet and a second scanning magnet. The scattering device and the range adjustment device are combined together and moved along a beam axis, whereas the Bragg peak spreading device is moved independently along the beam axis. The scattering device moves to adjust the degree of ion beam scattering. The range adjustment device moves to adjust ion beam scatter changes caused by an absorber thickness adjustment. The Bragg peak spreading device moves to adjust ion beam scatter changes arising out of an SOBP device. These adjustments provide uniformity of radiation dose distribution for the diseased part.
申请公布号 US7026636(B2) 申请公布日期 2006.04.11
申请号 US20040760422 申请日期 2004.01.21
申请人 HITACHI, LTD. 发明人 YANAGISAWA MASAKI;AKIYAMA HIROSHI;MATSUDA KOJI;FUJIMAKI HISATAKA
分类号 G21K1/093;G21K5/04;H05H9/00;A61N5/10;G21K1/10;G21K3/00;G21K5/00;H05H13/04 主分类号 G21K1/093
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