发明名称 Method of forming thin film transistors having tapered gate electrode and curved insulating film
摘要 TFTs arranged in various circuits have structures that are suited for circuit functions, in order to improve operation characteristics and reliability of the semiconductor device, to lower consumption of electric power, to decrease the number of steps, to lower the cost of production and to improve the yield. The gradient of concentration of impurity element for controlling the conduction type in the LDD regions 622 and 623 of the TFT is such that the concentration increases toward the drain region. For this purpose, a tapered gate electrode 607 and a tapered gate-insulating film 605 are formed, and the ionized impurity element for controlling the conduction type is added to the semiconductor layer through the gate-insulating film 605.
申请公布号 US7026194(B2) 申请公布日期 2006.04.11
申请号 US20020317064 申请日期 2002.12.12
申请人 发明人
分类号 G09F9/30;H01L21/00;G02F1/1345;G02F1/136;G02F1/1368;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/786 主分类号 G09F9/30
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