| 摘要 |
PROBLEM TO BE SOLVED: To provide an OFDM wave delay profile measuring device in which the length of maximum delay time capable of measuring a delay wave, the time resolution capable of measuring a delay wave, the level capable of measuring a delay wave, the precision of delay wave level, and the false pulse response in the delay profile measuring method can be eliminated. SOLUTION: The OFDM wave delay profile measuring device 1 comprises a means 13 for measuring a delay profile including the delay time of OFDM delay wave and the DU ratio indicative of the intensity ratio between direct wave and delay wave of the OFDM wave. It is further provided with an OFDM wave receiving means 3, a direct wave estimating means 5, a frequency region converting means 7, a transfer function deriving means 9, a delay profile converting means 11, and a measurement decision/output means 15. COPYRIGHT: (C)2006,JPO&NCIPI
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