发明名称 DEEP TRENCH ELECTRICALLY ISOLATED MEDIUM VOLTAGE CMOS DEVICES AND METHOD FOR MAKING THE SAME
摘要 <p>A medium voltage CMOS semiconductor device (20) provides for higher transistor (201) densities by using a deep trench structure (230) to electrically isolate adjacent transistors (210). The device includes a semiconductor substrate (200); first and second medium voltage MOS transistors (210) each having a channel region (215) in the semiconductor substrate (200); a field oxide region (220) on the semiconductor substrate (200) extending between and separating the first and second medium voltage MOS transistors (210); a trench (230) extending from the field oxide region (220) down to a depth greater than a depth of space charge regions of the first and second medium voltage MOS transistors (210); and a dielectric material disposed in the trench (230).</p>
申请公布号 WO2006035387(A1) 申请公布日期 2006.04.06
申请号 WO2005IB53143 申请日期 2005.09.22
申请人 KONINKLIJKE PHILIPS ELECTRONICS, N.V.;ALBU, LUCIAN REMUS;HAUSSER, STEFAN;EUEN, WOLFGANG;SCHLIGTENHORST, HOLGER 发明人 ALBU, LUCIAN REMUS;HAUSSER, STEFAN;EUEN, WOLFGANG;SCHLIGTENHORST, HOLGER
分类号 H01L21/8238;H01L21/8234 主分类号 H01L21/8238
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