发明名称 Portable conformable deep ultraviolet master mask
摘要 Mastering techniques are described that can improve the quality of a master used in data storage disk manufacturing. In particular, the techniques can improve resolution of the features created on the master. The techniques include coating a master substrate layer with a tri-layer structure composed of a top photoresist layer, a bottom photoresist layer, and a non-resist layer interposed between the two photoresist layers. The bottom photoresist layer comprises a deep ultraviolet (DUV) resist material. Mastering the top photoresist layer defines a portable conformable mask (PCM) for the bottom photoresist layer. A variety of PCM may be defined for the bottom photoresist layer. The PCM may be defined using conventional tip recording with a focused laser spot that provides fine feature definition. A blanket DUV light may then illuminate the bottom photoresist layer through the PCM to provide enhanced feature resolution in a data storage disk master.
申请公布号 US2006073422(A1) 申请公布日期 2006.04.06
申请号 US20040953198 申请日期 2004.09.28
申请人 IMATION CORP. 发明人 EDWARDS JATHAN D.;MORKVED TERRY L.
分类号 G03C5/00 主分类号 G03C5/00
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