发明名称 System and method for phase shift assignment
摘要 A semiconductor design is provided having at least one feature at one of a line end and a line junction, and phase regions. At least one cut line is added to at least one of such features at line ends and such features at line junctions. Phases are assigned to the phase regions. The manufacturing of a photomask with the assigned phase regions is directed.
申请公布号 US2006075376(A1) 申请公布日期 2006.04.06
申请号 US20040942689 申请日期 2004.09.15
申请人 CHARTERED SEMICONDUCTOR MANUFACTURING, LTD. 发明人 TAN SIA KIM;LIN QUNYING;HSIA LIANG-CHOO
分类号 G03F1/00;G06F17/50 主分类号 G03F1/00
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