发明名称 IO METAL RING STRUCTURE AND ON-CHIP DECOUPLING CAPACITANCE USING IO METAL RING
摘要 <p>There are provided a metal I/O ring structure for a semiconductor chip and a decoupling capacitance structure using the same. In the Metal I/O ring structure, a plurality of first metal lines are formed on a first metal layer and connected with a power supply voltage, and a plurality of second metal lines are formed on the first metal layer and connected with a ground voltage. The second metal lines are arranged neighboring to the first metal lines. The second metal lines are connected with a second metal layer disposed below the first metal lines on the metal layer, and the first metal lines are connected with the second metal layer disposed below the second metal lines on the first metal layer. An insulating layer is disposed between the first metal layer and the second metal layer, thereby forming a decoupling capacitance between the first metal lines and the second metal lines.</p>
申请公布号 KR20060029550(A) 申请公布日期 2006.04.06
申请号 KR20040078547 申请日期 2004.10.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JIN, WOO JIN
分类号 H01L21/60 主分类号 H01L21/60
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