发明名称 OPHTHALMOLOGIC EXAMINATION APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To examine an ophthalmologic disease at a health check level on the basis of measurement data by detecting a cross-sectional shape of an anterior ocular part of an eye to be examined as quantitative measurement data. <P>SOLUTION: The ophthalmologic examination apparatus 20 is used for examining an ophthalmologic disease of an eye to be examined by detecting a cross-sectional shape of the anterior ocular part of the eye to be examined. The apparatus comprises a slit light projecting optical system for projecting a slit light to the anterior ocular part of the eye to be examined from the pupil to the periphery of the iris while moving the slit light for scanning, a measurement section 30 having a photographing optical system for photographing a cross-sectional image of the anterior ocular part resulting from reflected light of the slit light, a rack section 40 having a driving device for moving and controlling the measurement section 30 in X-Y direction and in Z direction, an operation panel 50 arranged above the measurement section 30, and a data analyzing section for analyzing the cross-sectional image photographed by the photographing optical system and for analyzing the shape of the anterior ocular section of the eye to be examined. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006087614(A) 申请公布日期 2006.04.06
申请号 JP20040275810 申请日期 2004.09.22
申请人 KASHIWAGI KENJI;TAKAGI SEIKO CORP 发明人 KASHIWAGI KENJI;YODA MASASHI;TAGAWA KOJI;NAKAYAMA JUNJI;KANAZAWA SHIGEO
分类号 A61B3/117 主分类号 A61B3/117
代理机构 代理人
主权项
地址