| 摘要 |
PROBLEM TO BE SOLVED: To provide an easy and inexpensive method for measuring the film thickness of a surface layer capable of measuring the film thickness nondestructively. SOLUTION: The present invention is a method for measuring the film thickness of a surface layer of a charging device containing a white conductive material or a conductive material and white fine powders in its surface layer. The surface layer is irradiated with light and the film thickness is calculated from the reflection density. COPYRIGHT: (C)2006,JPO&NCIPI
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