发明名称 CONTACT PROBE
摘要 PROBLEM TO BE SOLVED: To reduce and stabilize a contact resistance of a contact probe. SOLUTION: This contact probe is equipped with a barrel 3 comprising a conductive cylindrical body; a conductive plunger 2 disposed movably in the barrel 3, and having a contact end 2C projecting from the barrel 3 and a bias end 2B inclined to a barrel 3 section; a spring 4 disposed in the barrel 3, for energizing the plunger 3 in the axial direction; and a conductive bias pin 5 sandwiched between the plunger 2 and the spring 4, disposed in the contactable state with the inner surface of the barrel 3, longer than the inner diameter of the barrel 3, and having the plunger 2 side end whose diameter is reduced into a tapered shape. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006090941(A) 申请公布日期 2006.04.06
申请号 JP20040279245 申请日期 2004.09.27
申请人 JAPAN ELECTRONIC MATERIALS CORP 发明人 HANESAKA MASATOSHI
分类号 G01R1/067;G01R31/26 主分类号 G01R1/067
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